About

About WEVE WEVE develops advanced optical inspection and metrology solutions tailored for Micro LED manufacturing, addressing the challenges of inspecting millions of devices with high speed and precision. Its inspection platforms integrate Automated Optical Inspection (AOI), photoluminescence (PL), and colorimetric analysis (xyY) to enable comprehensive evaluation of structural defects, emission characteristics, and uniformity. Covering the full production flow from epitaxial wafers to CoW, CoC, and final panels, WEVE’s non-destructive systems deliver high-throughput, high-resolution data essential for yield improvement and process optimization. With capabilities such as simultaneous RGB inspection and machine-learning-based defect analysis, WEVE supports manufacturers in accelerating Micro LED commercialization.