About

About Bowman Analytics, Inc. About Bowman Analytics Bowman is the premier manufacturer of world-class, American made XRF plating thickness measurement instrument with guaranteed IPC 4552 to 4556 capability. All Bowman XRFs come standard with a Silicon Drift Detector with high resolution and stability for precise and quick measurements. Close proximity of the long-life micro-focus X-ray tube to the detector produces more than 3X the photon counts of conventional XRFs in a shorter time. XYZ programmable stage allows for quick and consistent quality assurance. Measure up to 5 thickness layers and 30 elemental compositions simultaneously. Bowman is the premier manufacturer of world-class, American made XRF plating thickness measurement instrument with guaranteed IPC 4552 to 4556 capability. With a line of 9 models, Bowman XRF are uniquely equipped to meet the plating requirements from all industries. All Bowman XRFs come standard with a Silicon Drift Detector with high resolution and stability for precise and quick measurements. Close proximity of the long-life micro-focus X-ray tube to the detector produces more than 3X the photon counts of conventional XRFs in a shorter time. A variable focus camera makes measurements in recessed areas as simple as a click. Partnered with the high precise stage, XYZ programmable stage allows for quick and consistent quality assurance. New Archer software speeds and simplifies precise measurements of up to 5 layers.